8 results
A Piezoelectric Goniometer Inside a Transmission Electron Microscope Goniometer
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 13 September 2011, pp. 827-833
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- October 2011
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Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 4 / August 2011
- Published online by Cambridge University Press:
- 12 July 2011, pp. 637-642
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- August 2011
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The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 3 / June 2009
- Published online by Cambridge University Press:
- 22 May 2009, pp. 237-243
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- June 2009
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Three-Dimensional Microstructural Characterization Using Focused Ion Beam Tomography
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- Journal:
- MRS Bulletin / Volume 32 / Issue 5 / May 2007
- Published online by Cambridge University Press:
- 31 January 2011, pp. 408-416
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- May 2007
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The information content of lattice resolved high angle tilt series of nanoparticles
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1026 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1026-C08-04
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- 2007
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Electron Tomography of SPM Probes, Nanoparticles and Precipitates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 982 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0982-KK02-04
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- 2006
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Unlimited Tilt for Ultra-Narrow Lenses: Tomography at Highest Resolution?
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1196-1197
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- August 2004
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Nanoscale 3D Chemical Mapping by Spectroscopic Electron Tomography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G1.2
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- 2002
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